X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 291 30% PEG 300, 100mM MES, 2% MPD, 10 mM HEPES, 100 mM NaCl, 1 mM DTT, 0.5 mM IP6, 0.5 mM ADP, 5% glycerol, VAPOR DIFFUSION, HANGING DROP, temperature 291K, pH 6.5
Unit Cell:
a: 206.984 Å b: 206.984 Å c: 206.984 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 21 3
Crystal Properties:
Matthew's Coefficient: 4.71 Solvent Content: 73.89
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 4.0010 103.4920 12612 1245 99.9100 0.2171 0.2393 157.7706
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
4.001 146.365 100.000 0.091 0.091 12.700 7.000 12618 12618 0.0 -3.0 151
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 4.000 4.220 100.000 ? 0.617 1.200 7.200 1809
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.3.1 1.116 ALS 8.3.1
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling 3.2.5
PHASER phasing .
PHENIX refinement 1.7_650
PDB_EXTRACT data extraction 3.10
ELVES refinement .