X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 9.5 293 0.2 M lithium sulfate, 0.8 M sodium-potassium trtarate, 0.1 M CHES, pH 9.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 76.320 Å b: 102.181 Å c: 139.062 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 2 2 2
Crystal Properties:
Matthew's Coefficient: 3.60 Solvent Content: 65.81
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.640 39.62 14998 753 91.66 0.1930 0.2550 67.36
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.64 39.62 ? 0.049 0.049 29.4 3.7 16308 16308 1 1 45.8
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.64 2.69 98.1 ? 0.469 3.1 3.7 826
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97926 APS 19-ID
Software
Software Name Purpose Version
HKL-3000 data collection .
PHENIX model building .
PHENIX refinement (phenix.refine: 1.6.4_486)
HKL-3000 data reduction .
HKL-3000 data scaling .
PHENIX phasing .