X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 291 1.2M Na Citrate, 100mM Tris pH8.5, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 68.770 Å b: 68.770 Å c: 91.380 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 43 21 2
Crystal Properties:
Matthew's Coefficient: 2.01 Solvent Content: 38.89
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.16 42.93 11546 917 ? 0.238 0.258 36.43
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.160 50.000 100.0 0.10300 0.10300 19.7000 9.200 ? 12353 ? 0.000 31.33
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.16 2.20 100.0 ? 0.84600 2.000 8.50 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU FR-E+ DW ? ? ?
Software
Software Name Purpose Version
HKL-3000 data collection .
SHELXS phasing .
SOLVE phasing .
RESOLVE model building .
BUSTER refinement 2.8.0
Coot model building 0.6
HKL-3000 data reduction .
HKL-3000 data scaling .
RESOLVE phasing .