X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 292 0.1 M MOPS pH 7.0, 10% PEG4K, 12.5% MPD, 100 mM NaCl, VAPOR DIFFUSION, temperature 292K
Unit Cell:
a: 94.570 Å b: 115.630 Å c: 107.240 Å α: 90.00° β: 91.91° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 3.04 Solvent Content: 59.56
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.75 36.61 57812 5885 96.3 0.239 0.293 63.8
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.75 36.61 99 ? 0.082 14.7 4 ? 59660 ? -3 50.0
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.75 2.80 90.2 ? 0.33 2.7 3.0 2676
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 1.0 APS 21-ID-F
Software
Software Name Purpose Version
HKL-2000 data collection .
MERLOT phasing .
CNS refinement 1.3
HKL-2000 data reduction .
SCALEPACK data scaling .