X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8 297 1.8 M NaCl, 0.1 M Tris/HCl, VAPOR DIFFUSION, HANGING DROP, temperature 297K
Unit Cell:
a: 79.225 Å b: 79.225 Å c: 47.051 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 61
Crystal Properties:
Matthew's Coefficient: 3.25 Solvent Content: 62.19
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.85 25.932 14402 1102 98.80 0.1639 0.1908 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.85 50.00 98.7 0.095 ? 25.6 5.0 14603 14408 ? -3 22
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.85 1.88 95.9 ? ? 2.6 4.5 707
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.97923 APS 19-BM
Software
Software Name Purpose Version
SBC-Collect data collection .
SHELX model building .
MLPHARE phasing .
DM model building .
ARP/wARP model building .
Coot model building .
PHENIX refinement (phenix.refine: 1.6.4_486)
HKL-3000 data reduction .
HKL-3000 data scaling .
SHELX phasing .
DM phasing .
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