X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 289 MymaA.00778.a.A1 PS00869 at 45.9 mg/mL against PACT screen condition G10 20 mM Na/K phosphate, 0.1 M BisTris Propane pH 7.5, 20% PEG 3350 with 25% ethylene glycol as cryo-protection reagent, crsytal tracking ID 219070g10, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 125.640 Å b: 137.640 Å c: 73.960 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 2.85 Solvent Content: 56.83
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.2500 50.0000 29942 1502 97.1400 0.1745 0.2078 25.7658
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.250 50 97.500 0.129 ? 10.140 6 30064 30064 ? -3.000 30.055
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.250 2.310 82.700 ? ? 3.830 5.2 1858
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.1 0.97946 ALS 5.0.1
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.1.4
REFMAC refinement .
PDB_EXTRACT data extraction 3.10
BOS data collection .
XDS data reduction .
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