X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 291 precipitant solution containing 0.1 M NaAc, pH 4.6, 50mM (NH4)2SO4 and 15% PEG1000., VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 31.025 Å b: 31.025 Å c: 216.690 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 41 21 2
Crystal Properties:
Matthew's Coefficient: 2.17 Solvent Content: 43.44
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 1.900 29.826 15364 1513 96.43 0.2328 0.2553 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.90 30.7118 96.42 ? ? ? ? 15767 15364 0.0 ? 35.2
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.90 1.93 98.1 ? ? 6.7 9.7 455
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X12C 1.0 NSLS X12C
Software
Software Name Purpose Version
CrystalClear data collection .
HKL2Map model building .
PHENIX refinement (phenix.refine: 1.6.1_357)
d*TREK data reduction .
d*TREK data scaling .
HKL2Map phasing .