X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 0.1M NaHepes, pH 7.5, 4%PEG400, 2M Ammonium Sulfate, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 126.807 Å b: 126.807 Å c: 124.234 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 31 2 1
Crystal Properties:
Matthew's Coefficient: 3.39 Solvent Content: 63.75
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.30 50.00 47374 2536 96.65 0.16987 0.20994 47.199
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 50.0 96.6 0.092 0.092 25.3 4.1 50096 50096 0 -3 47.0
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.34 98.3 ? 0.660 2.6 4.1 2529
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9793 APS 19-ID
Software
Software Name Purpose Version
HKL-3000 data collection .
HKL-3000 phasing .
SHELXD phasing .
SHELXE model building .
DM model building .
MLPHARE phasing .
CCP4 model building .
RESOLVE model building .
ARP/wARP model building .
REFMAC refinement 5.6.0070
Coot model building .
HKL-3000 data reduction .
HKL-3000 data scaling .
DM phasing .
CCP4 phasing .
RESOLVE phasing .