X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 298 0.045M DL-Malic acid, 0.075M sodium formate 0.1M Na-Hepes 7.0, 10% PEG3350, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 69.276 Å b: 69.276 Å c: 177.643 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 41 21 2
Crystal Properties:
Matthew's Coefficient: 2.60 Solvent Content: 52.65
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 2.301 37.744 33816 1720 92.25 0.1917 0.2389 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 50 99.2 ? 0.105 24.7 7.8 ? 33816 ? ? 51.2
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.34 99.1 ? 0.868 2.2 7.3 965
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97920 APS 19-ID
Software
Software Name Purpose Version
HKL-3000 data collection .
MLPHARE phasing .
PHENIX refinement (phenix.refine: 1.6.4_486)
HKL-3000 data reduction .
HKL-3000 data scaling .