X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 293 2.1M ammonium sulfate; 0.1M Na acetate; Trehalose dihydrate, pH 4.6, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 62.433 Å b: 62.433 Å c: 149.595 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 61
Crystal Properties:
Matthew's Coefficient: 2.51 Solvent Content: 51.00
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.76 43.82 31882 1582 97.7 0.218 0.234 24.5
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.76 49.88 99.4 0.104 ? 12.8 22.5 32561 32561 0.0 0.0 21.8
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.76 1.81 99.3 ? ? ? 21.1 2536
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 0.9790 NSLS X29A
Software
Software Name Purpose Version
CBASS data collection .
SHELX model building .
SHARP phasing .
CNS refinement 1.1
HKL-2000 data reduction .
HKL-2000 data scaling .
SHELX phasing .
Feedback Form
Name
Email
Institute
Feedback