X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 289 0.1 M BIS-TRIS pH 6.5, 20 % w/v Polyethylene glycol monomethyl ether 5000, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 56.336 Å b: 68.992 Å c: 92.387 Å α: 73.36° β: 84.96° γ: 75.46°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.39 Solvent Content: 48.55
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.00 32.775 84091 4235 96.85 0.180 0.221 59.2
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.0 50 97.2 ? 0.087 12.5 2.1 84177 84177 0.0 0.0 37.17
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.0 2.03 93.3 ? 0.408 1.84 2.0 4022
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97934 APS 19-ID
Software
Software Name Purpose Version
SBC-Collect data collection .
HKL-3000 data collection .
HKL-3000 phasing .
SHELXS phasing .
MLPHARE phasing .
BUCCANEER model building .
PHENIX refinement (phenix.refine: 1.7_650)
HKL-3000 data reduction .
HKL-3000 data scaling .
BUCCANEER phasing .