X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 20% (v/v) 1,4-butanediol, 100 mM HEPES, 200 mM NaCl, pH 7.5, VAPOR DIFFUSION, temperature 293K
Unit Cell:
a: 173.267 Å b: 173.267 Å c: 173.267 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: F 4 3 2
Crystal Properties:
Matthew's Coefficient: 3.02 Solvent Content: 59.22
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS THROUGHOUT 1.8000 52.2420 21224 1091 99.9700 0.1762 0.2029 25.0372
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.80 100.04 100.00 0.102 ? 23.3291 32.39 21231 21231 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.80 1.90 99.99 ? ? ? 16.25 3002
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 1.7401 APS 17-ID
Software
Software Name Purpose Version
SCALA data processing CCP4_3.3.16
PHENIX refinement dev_661
PDB_EXTRACT data extraction 3.10
XDS data reduction .
SCALA data scaling .
Feedback Form
Name
Email
Institute
Feedback