X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7 277.15 20% PEG 3350, 0.15 M DL-malic acid, VAPOR DIFFUSION, HANGING DROP, temperature 277.15K
Unit Cell:
a: 86.955 Å b: 86.955 Å c: 130.363 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 32
Crystal Properties:
Matthew's Coefficient: 4.63 Solvent Content: 73.42
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.75 43.59 10617 533 98.93 0.20743 0.23456 81.634
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.75 75.31 98.2 0.126 ? 10.0 2.6 ? 10617 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.75 3.97 96.8 ? ? 2.70 2.5 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID29 0.97298 ESRF ID29
Software
Software Name Purpose Version
XDS data scaling .
CCP4 model building .
PHENIX model building .
PHENIX refinement (phenix.refine: 1.7_650)
XDS data reduction .
CCP4 phasing .
PHENIX phasing .
REFMAC refinement 5.5.0109