X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 294 0.05M Calcium Chloride, 0.1M Bis-Tris pH6.5, 1.6M Ammonium Sulfate. Cryoprotected with Paratone-N oil, VAPOR DIFFUSION, HANGING DROP, temperature 294K
Unit Cell:
a: 123.067 Å b: 123.067 Å c: 49.218 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 4
Crystal Properties:
Matthew's Coefficient: 2.96 Solvent Content: 58.40
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION PHASER ? 1.998 30.767 96971 3906 99.09 0.1571 0.1847 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.0 50 99.9 0.122 ? 24.75 7.7 50364 50298 ? -3.0 20.4
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.0 2.03 99.0 ? ? 4.13 7.1 2463
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.97918 APS 19-BM
Software
Software Name Purpose Version
PHENIX refinement 1.6_289
PHASER phasing .
REFMAC refinement 5.2.0019 plus PHENIX (phenix.refine: 1.6_289)
HKL-2000 data reduction .
HKL-2000 data scaling .
HKL-3000 data collection .