X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 293 0.2M ammonium sulfate, 0.1M BIS-TRIS pH 5.5, 25%w/v polyethylene glycol, 3350, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 109.607 Å b: 42.655 Å c: 61.289 Å α: 90.00° β: 116.82° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 1.84 Solvent Content: 33.28
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.10 50.00 14059 738 98.78 0.20170 0.23747 38.860
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.10 50.0 98.8 0.07 0.07 21.5 2.5 14965 14965 0 -3 31.9
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.14 99.6 ? 0.405 2.5 2.5 734
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-G 0.9786 APS 21-ID-G
Software
Software Name Purpose Version
MD2 data collection .
HKL-3000 phasing .
MOLREP phasing .
REFMAC refinement 5.6.0070
Coot model building .
HKL-3000 data reduction .
HKL-3000 data scaling .
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