X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 293 0.18M tri-Sodium citrate, 0.1M TrisHCl pH 8.0, 30% PEG, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 103.123 Å b: 89.876 Å c: 65.154 Å α: 90.00° β: 107.03° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.70 Solvent Content: 54.49
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.19 36.45 23060 1204 83.06 0.21766 0.29325 16.196
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.14 50.00 99.6 0.057 0.057 33.889 4.4 ? 28962 -3 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.14 2.24 99.7 ? ? 2.09 3.4 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97929 APS 19-ID
Software
Software Name Purpose Version
HKL-3000 data collection .
MOLREP phasing .
REFMAC refinement 5.5.0110
HKL-3000 data reduction .
HKL-3000 data scaling .