X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 300 00 mM Tris-HCl, pH 7.5, 20-25% ethylene glycol, 200-400mM Tartaric Acid, 5% glycerol,12% polyethylene glycol 4000, VAPOR DIFFUSION, SITTING DROP, temperature 300K
Unit Cell:
a: 102.709 Å b: 102.709 Å c: 257.044 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 65 2 2
Crystal Properties:
Matthew's Coefficient: 3.28 Solvent Content: 62.48
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.25 30 36579 1950 98.73 0.20162 0.24216 43.859
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.25 30 99.5 ? ? ? ? 38530 38530 1 1 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.25 2.33 98.5 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CAMD BEAMLINE GCPCC 1.3808 CAMD GCPCC
Software
Software Name Purpose Version
HKL-2000 data collection .
REFMAC refinement 5.2.0019
HKL-2000 data reduction .
HKL-2000 data scaling .
REFMAC phasing 5.2.0019
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