X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 292 20%(w/v) PEG3350, 0.5M potassium thiocyanate and 7% glycerol, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 292K
Unit Cell:
a: 52.525 Å b: 59.080 Å c: 56.144 Å α: 90.00° β: 101.26° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.26 Solvent Content: 45.53
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.757 40.281 28191 1438 83.65 0.2092 0.2353 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.757 50.0 93.2 0.088 0.01247 10.9 2.8 31389 31389 . . ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.757 1.79 58.1 ? 1.037 1.3 2.4 971
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 110 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-2 0.933 ESRF ID14-2
Software
Software Name Purpose Version
HKL-2000 data collection .
PHENIX model building (AutoMR)
PHENIX refinement (phenix.refine: dev_412)
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing (AutoMR)
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