ISDA: 3Q2N

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	4.6	293	25% (v/v) PEG 400, 0.1M sodium acetate pH4.6, 0.15M CaCl2 and croprotected by increasing PEG 400 to 30%., VAPOR DIFFUSION, HANGING DROP, temperature 293K

Unit Cell:

a: 140.851 Å b: 169.493 Å c: 131.355 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: C 2 2 2

Crystal Properties:

Matthew's Coefficient: 8.43 Solvent Content: 85.40

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.73	20.00	39137	2089	98.08	0.20243	0.22436	31.296

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.73	40	99.98	?	0.116	?	6.9	41348	41339	?	-3	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.73	2.85	100	?	0.505	4.3	6.7	4056

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	NSLS BEAMLINE X4C	0.979	NSLS	X4C

Software