X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.9 292 100 mM Tris, pH 6.9, 20% PEG 3350, 200 mM ammonium citrate, VAPOR DIFFUSION, SITTING DROP, temperature 292K
Unit Cell:
a: 50.221 Å b: 120.967 Å c: 134.117 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 2 2 2
Crystal Properties:
Matthew's Coefficient: 2.53 Solvent Content: 51.46
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 1.8000 9.9950 37881 1870 99.5100 0.1844 0.2044 23.2845
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 17.3 99.5 0.049 0.045 27.4 6.0 ? 37883 0 1.34 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.8 17.3 99.6 ? 0.072 16.7 5.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.96 SLS X06SA
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling .
SHARP phasing .
SOLOMON phasing .
PHENIX refinement 1.6_289
PDB_EXTRACT data extraction 3.10
RemDAq data collection .
Feedback Form
Name
Email
Institute
Feedback