X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.3 293 40% (v/v) MPD, 0.2 M CaCl2, pH 7.3, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 39.140 Å b: 39.140 Å c: 118.190 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 63
Crystal Properties:
Matthew's Coefficient: 3.03 Solvent Content: 59.43
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD, MOLECULAR REPLACEMENT ? 1.500 19.389 16144 806 98.65 0.1601 0.1817 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.5 20 98.6 ? 0.05 30.4 12.5 16414 16181 ? -3 22.7
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.5 1.54 97.4 ? 0.27 8.95 12.09 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.0722 SLS X06DA
Software
Software Name Purpose Version
MAR345dtb data collection .
SHELX model building (anomalous dataset)
ARP/wARP model building .
PHENIX refinement (phenix.refine: 1.6_289)
XDS data reduction .
XSCALE data scaling .
SHELX phasing (anomalous dataset)