ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.5	293	25% PEG 3350, 0.2M MgCl2, 0.1M Hepes 7.5, 5mM CaCl2, 2.5mM MgCl2, glycerol, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Unit Cell:

a: 47.019 Å b: 51.378 Å c: 51.639 Å α: 68.530° β: 65.750° γ: 64.490°

Symmetry:

Space Group: P 1

Crystal Properties:

Matthew's Coefficient: 2.21 Solvent Content: 44.31

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SAD/MR	THROUGHOUT	2.0000	26.6100	24815	1268	95.01	0.2004	0.2252	44.8422

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.000	50.000	95.100	0.041	?	18.800	4.000	26094	24816	0	0	33.1

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.000	2.030	88.500	?	?	3.46	3.800	1163

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
ROTATING ANODE	RIGAKU FR-E+ SUPERBRIGHT	1.54178	?	?

Software