X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5 291 16% PEG 8000, 0.125M CALCIUM CHLORIDE, 0.1M SODIUM ACETATE, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 168.394 Å b: 84.056 Å c: 89.325 Å α: 90.00° β: 100.39° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.27 Solvent Content: 45.90
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.500 43.930 195114 9754 99.79 0.1649 0.1815 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.50 46.15 99.8 ? 0.051 25.7 ? ? 195124 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.50 1.59 99.2 ? .341 5.9 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X6A 0.9770 NSLS X6A
Software
Software Name Purpose Version
PHENIX model building .
PHENIX refinement (phenix.refine: 1.6.1_357)
XDS data reduction .
XSCALE data scaling .
PHENIX phasing .
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