X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 277 0.2000M calcium acetate, 10.0000% polyethylene glycol 8000, 0.1M Imidazole pH 8.0, 0.003 M S-adenosyl methionine (SAM), NANODROP', VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 67.107 Å b: 78.776 Å c: 84.105 Å α: 93.880° β: 102.080° γ: 103.540°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.91 Solvent Content: 57.68
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.5000 29.465 54348 2758 ? 0.2151 0.2394 42.6014
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.50 29.465 88.400 0.083 ? 6.240 ? ? 54374 ? -3.000 50.744
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.500 2.590 75.800 ? ? 2.0 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.2 0.9537,0.9796,0.9793 ALS 8.2.2
Software
Software Name Purpose Version
SHELX phasing .
BUSTER-TNT refinement BUSTER 2.8.0
XSCALE data scaling .
PDB_EXTRACT data extraction 3.10
XDS data reduction .
SHELXD phasing .
autoSHARP phasing .
BUSTER refinement 2.8.0