X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 298 0.1 M NaCl, 2.0M AS, 0.1 M Tris pH=8.6-8.8, 10 mg/mL , pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 152.430 Å b: 54.140 Å c: 130.300 Å α: 90.00° β: 123.32° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.49 Solvent Content: 50.64
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.10 20.00 49526 2606 100.00 0.21693 0.26366 16.482
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.05 25 99.5 0.139 0.119 9.1 3.8 56330 56058 3 3 25.4
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.05 2.10 99.6 ? 0.499 2.7 2.7 4164
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.2 0.91841 BESSY 14.2
Software
Software Name Purpose Version
MAR345dtb data collection .
PHASER phasing .
REFMAC refinement 5.6.0085
XDS data reduction .
XDS data scaling .