ISDA: 3P1U

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	4.47	293	1.13M ammonium sulfate, 0.1M phosphate-citrate pH 4.47, NANODROP, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Unit Cell:

a: 130.242 Å b: 130.242 Å c: 114.822 Å α: 90.000° β: 90.000° γ: 120.000°

Symmetry:

Space Group: P 6

Crystal Properties:

Matthew's Coefficient: 2.35 Solvent Content: 47.72

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MAD	THROUGHOUT	2.05	28.70	69269	3503	?	0.244	0.265	18.77

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.050	28.701	100.0	0.25200	0.25200	7.3000	5.700	?	69272	?	?	16.65

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.05	2.10	100.0	?	0.96500	0.800	5.70	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SSRL BEAMLINE BL11-1	0.91837,0.97916,0.97860	SSRL	BL11-1

Software