X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7 297 Crystallization solution contained 0.1M Tris pH 7, 17% PEG8000, and 0.2M MgCl2. The crystal was transferred to a hanging drop containing 0.1M Tris pH 7, 75mM MaCl, 0.2M MgCl2, and 20% PEG800, which was then placed over a vapor diffusion chamber containing a sitting drop bridge with 25% glutaraldehyde. The crystal was cross-linked for 8 minutes at room temperature, then transferred to a soaking solution containing 0.1M Tris pH 7, 75mM NaCl, 0.2M MgCl2,20% PEG8000, 11.6mM trimethyl lead acetate, and 9.63mM triethyl lead acetate for 43 hrs at room temperature. The soaked crystal was then transferred to a cryoprotectant (0.1M Tris pH 7, 75mM NaCl, 0.2M MgCl2, 20% PEG8000, 15% ethylene glycol, 11.9mM trimethyl lead acetate, and 13.75mM triethyl lead acetate) in four steps, then flash frozen in liquid nitrogen. , VAPOR DIFFUSION, SITTING DROP, temperature 297K
Unit Cell:
a: 67.963 Å b: 75.931 Å c: 90.784 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.19 Solvent Content: 43.72
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.75 37.97 45460 1962 94.7 0.195 0.217 23.3
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.75 50.00 96.8 ? 0.097 26.5 13.6 46402 46402 -3 -3 17.8
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.75 1.78 68.7 ? 0.371 3.56 7.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 93 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 0.94 APS 22-ID
Software
Software Name Purpose Version
MAR345 data collection .
AutoBuild model building .
CNS refinement 1.2
HKL-2000 data reduction .
HKL-2000 data scaling .
AutoBuild phasing .