ISDA: 3OVX

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	5	298	Composition of crystallisation solution (including components from protein prep) 50 mM NaAcetate; 0.25 M NaCl; 4 mM MMTS: 26% PEG 4K; 0.1 M NaCitrate pH=5.0; 0,2 M (NH4)2SO4; 10 mM DMSO; 10 mM DTT Crystallisation method and temperature Hanging drop; RT Cryoprotectant composition 30% PEG 4K, 0.1 M NaCitrate pH=5.0; 0.2 M (NH4)2SO4; 15% PEG 400 (+ 10% compound) , soaking cat S crystals, temperature 298K

Unit Cell:

a: 85.545 Å b: 85.545 Å c: 150.571 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: P 41 2 2

Crystal Properties:

Matthew's Coefficient: 2.86 Solvent Content: 56.92

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	1.49	74.38	78873	4178	89.81	0.20168	0.22614	13.608

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.49	74.38	89.8	0.082	?	?	?	?	83072	?	1.1	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		? K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
ROTATING ANODE	RIGAKU	?	?	?

Software