X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 291 0.7-0.8M succinate, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 58.037 Å b: 59.687 Å c: 145.063 Å α: 90.00° β: 97.21° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.07 Solvent Content: 40.52
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.094 40.814 15972 827 87.32 0.1924 0.2484 60.5
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.094 40.814 87.4 0.631 0.113 9.9 3.4 18293 15986 ? ? 53.43
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.10 3.21 70.8 ? 0.39 1.73 2.4 1290
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.3.1 1.115872 ALS 8.3.1
Software
Software Name Purpose Version
ELVES refinement .
PHENIX model building - Phaser
PHENIX refinement (phenix.refine: 1.6.1_357)
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing - Phaser