X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.14 277 30.40% 1,4-butanediol, 0.1M sodium acetate pH 4.14, NANODROP, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 119.600 Å b: 119.600 Å c: 119.600 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 2 3
Crystal Properties:
Matthew's Coefficient: 3.34 Solvent Content: 63.17
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 1.96 48.83 41141 2066 ? 0.217 0.239 55.26
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.960 48.826 100.0 ? ? ? ? ? 41141 ? -3.000 36.33
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.96 2.03 100.0 ? ? 1.700 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-2 ? SSRL BL9-2
Software
Software Name Purpose Version
BUSTER-TNT refinement BUSTER 2.8.0
XSCALE data scaling .
PDB_EXTRACT data extraction 3.10
XDS data reduction .
SHELXD phasing .
autoSHARP phasing .
BUSTER refinement 2.8.0
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