X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.4 294 0.1 M HEPES, pH 7.4, 0.2 M (NH4)2SO4 plus 20% (w/v) PEG3350, VAPOR DIFFUSION, HANGING DROP, temperature 294K
Unit Cell:
a: 29.373 Å b: 59.559 Å c: 37.566 Å α: 90.00° β: 91.84° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.23 Solvent Content: 44.78
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 1.694 26.333 14348 720 99.26 0.1525 0.1856 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.68 40 97.92 ? 0.04 51.8 6 ? 14366 ? 3 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.68 1.74 83.2 0.246 ? 5.4
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-D 0.97949 APS 23-ID-D
Software
Software Name Purpose Version
PHENIX refinement 1.6_289
SHELX model building C/D/E
REFMAC refinement 5.5.0072
HKL-2000 data reduction .
HKL-2000 data scaling .
SHELX phasing C/D/E
HKL-2000 data collection .