X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.3 293 17% 2-methyl-2,4-pentanediol (MPD), 2% polyethylene glycol 6000 (PEG 6000), and 100 mM NaOAc (pH 5.3), VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 48.840 Å b: 75.900 Å c: 182.730 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.99 Solvent Content: 58.88
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD/MR THROUGHOUT 2.1000 43.0720 71824 3518 93.8000 0.2044 0.2349 35.8910
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.100 45.680 95.900 0.086 ? 6.700 3.290 73486 66438 ? 2.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.100 2.180 92.500 ? ? 2.5 3.240 7076
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 4.2.2 0.979 ALS 4.2.2
Software
Software Name Purpose Version
d*TREK data processing 9.7LDz
PHENIX refinement 1.6.2_432
PDB_EXTRACT data extraction 3.10
Blu-Ice data collection .
d*TREK data reduction .
d*TREK data scaling .
SHARP phasing .