X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 277 0.02 M MgCl2, 0.1 M HEPES, 22% polyacrylic acid 5100 sodium salt, strontium chloride 0.01 M, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 66.57 Å b: 90.39 Å c: 49.19 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 2
Crystal Properties:
Matthew's Coefficient: 2.29 Solvent Content: 46.21
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.09 27.45 18056 1297 99.36 0.21601 0.25574 25.400
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.09 50.0 99.8 0.100 ? 19.7 4.5 ? 18169 ? -3 29.0
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.14 100 ? ? 2.4 4.5 900
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.97924, 0.9793992, 0.9796705 APS 19-BM
Software
Software Name Purpose Version
SBC-Collect data collection .
Auto-Rickshaw phasing .
SHELXD phasing .
ABS model building .
SHARP phasing .
DM model building .
HELICAP model building .
Coot model building .
REFMAC refinement 5.5.0109
HKL-3000 data reduction .
HKL-3000 data scaling .
ABS phasing .
DM phasing .
HELICAP phasing .