X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 289 6.48 mg/mL LyraA.17086.a.D14 PD00142 in 25 mM Tris pH 8, 0.2 M NaCl, 1 mM TCEP, 1% glycerol against Emerald Biosystems Wizard Full screen condition A8 2 M ammonium sulphate, 0.1 M Citrate pH 5.5, 16 C, 0.4 uL protein and 0.4 uL precipitant, crystal tracking ID 216420a8, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 91.980 Å b: 44.080 Å c: 74.580 Å α: 90.00° β: 127.80° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.46 Solvent Content: 50.0
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.2000 37.64 11947 569 98.1300 0.1749 0.2250 22.7096
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.200 50 97.800 0.071 ? 19.010 7.0 12248 11974 ? -3.000 29.937
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.200 2.260 81.300 ? ? 9.1 5.6 868
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU FR-E+ SUPERBRIGHT 1.5418 ? ?
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.1.4
REFMAC refinement .
PDB_EXTRACT data extraction 3.10
StructureStudio data collection .
XDS data reduction .