X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 33 % PEG3350, 0.05 M KSCN, 0.1 M BisTrisHCl, pH 6.5, vapor diffusion, temperature 293K
Unit Cell:
a: 35.687 Å b: 48.256 Å c: 62.944 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 1.93 Solvent Content: 36.34
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R 1.1500 20.0000 30614 1922 93.1000 0.1242 0.161 15.4614
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.150 38.296 98.300 0.047 0.047 17.700 4.900 ? 38609 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.150 1.210 95.100 ? 0.325 2.3 3.200 5326
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.9794 SLS X10SA
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling 3.2.5
MOLREP phasing .
SHELX refinement .
PDB_EXTRACT data extraction 3.10
SHELXL-97 refinement .