X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 291 USING 1.0 MICROLITER DROPS CONTAINING EQUAL VOLUMES OF PROTEIN CONCENTRATE (2.8 MG/ML) AND SOLUTION CONTAING 0.1M SODIUM CITRATE/CITRIC ACID PH 5.5, 0.1M SODIUM CHLORIDE, 0.1M LITHIUM SULPHATE, 30% V/V PEG 400, Microbatch, temperature 291K
Unit Cell:
a: 53.540 Å b: 53.540 Å c: 41.250 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 42
Crystal Properties:
Matthew's Coefficient: 2.70 Solvent Content: 54.4
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION Sulfur SAD THROUGHOUT 2.30 37.86 5325 536 98.8 0.232 0.268 50.0
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 50 99.9 ? 0.045 124.7 25.0 ? 5325 ? ? 37.5
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.38 99.2 ? 0.254 17.4 13.4 5325
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.9 APS 22-ID
Software
Software Name Purpose Version
SGXPRO model building .
CNS refinement 1.3
HKL-2000 data reduction .
HKL-2000 data scaling .
SGXPRO phasing .