X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 10.9 277 0.2000M lithium sulfate, 2.5000M ammonium sulfate, 0.1M CAPS pH 10.9, NANODROP, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 44.105 Å b: 45.773 Å c: 65.892 Å α: 75.960° β: 71.080° γ: 63.350°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.27 Solvent Content: 45.74
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.7000 29.402 46346 2349 97.3600 0.1540 0.1872 15.2051
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.70 29.402 97.300 ? 0.074 7.400 2.000 46352 46352 ? ? 11.168
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.700 1.740 95.800 ? 0.317 2.4 2.000 3394
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-2 0.91837,0.97936 SSRL BL9-2
Software
Software Name Purpose Version
SHELX phasing .
REFMAC refinement 5.5.0110
SCALA data scaling 3.3.15
PDB_EXTRACT data extraction 3.10
MOSFLM data reduction .
SHELXD phasing .
autoSHARP phasing .
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