ISDA

3O0Y

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	5.5	289	0.2M Lithium sulfate monohydrate, 0.1M Bis-tris pH5.5, 25% PEG3350, VAPOR DIFFUSION, SITTING DROP, temperature 289K

Unit Cell:

a: 67.954 Å b: 94.471 Å c: 93.894 Å α: 114.32° β: 91.11° γ: 100.43°

Symmetry:

Space Group: P 1

Crystal Properties:

Matthew's Coefficient: 2.63 Solvent Content: 53.26

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MAD	THROUGHOUT	1.70	85.13	206348	10876	95.34	0.14796	0.18545	11.486

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.70	85.13	95.34	0.086	?	9.85	1.4	216434	206348	1.0	1.0	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.703	1.747	72.08	?	?	1.0	1.2	16813

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 19-ID	0.9794, 0.9796	APS	19-ID

Software