X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 289 150nl condition Morpheus A9 (0.06M divalents, 0.1M Tris/Bicine pH 8.5, 30% PEG550mme/PEG20K) and 150nl additive G10 (0.2% w/v 1,4-Cyclohexanedicarboxylic acid, 0.2% w/v 2,5-Pyridinedicarboxylic acid, 0.2% w/v Glutaric acid, 0.2% w/v trans-1,2-Cyclohexanedicarboxylic acid, 0.2% w/v trans-Aconitic acid, 0.02 M HEPES sodium pH 6.8) , VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 72.882 Å b: 76.685 Å c: 82.646 Å α: 88.63° β: 64.17° γ: 75.70°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.76 Solvent Content: 55.46
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.99 40.81 100680 1025 95.60 0.19441 0.23719 32.813
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.99 50 ? ? 0.054 12.7 ? ? 106279 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I02 0.979 Diamond I02
Software
Software Name Purpose Version
HKL-2000 data collection .
PHASER phasing .
REFMAC refinement 5.5.0109
HKL-2000 data reduction .
HKL-2000 data scaling .