X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 277 30-35% PEG 3350, 0.1 M Tris pH8.5, 0.2 M (NH4)2SO4, 150 mM NaCl, VAPOR DIFFUSION, HANGING DROP, temperature 277K
Unit Cell:
a: 173.570 Å b: 101.944 Å c: 90.288 Å α: 90.000° β: 110.420° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.52 Solvent Content: 51.10
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 3.130 48.5670 24662 3619 92.3100 0.2168 0.2657 102.9096
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.13 49 99 ? 0.092 ? 3.8 ? 25929 2.0 2.0 70.460
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.13 3.17 100 ? 0.59 2.2 3.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 14-ID-B 1.282 APS 14-ID-B
Software
Software Name Purpose Version
PHENIX refinement .
PDB_EXTRACT data extraction 3.10
ADSC data collection Quantum
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing .