X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 200 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| ROTATING ANODE | RIGAKU FR-E DW | 1.54 | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| d*TREK | data scaling | 9.6L |
| CNS | refinement | . |
| PDB_EXTRACT | data extraction | 3.10 |
| StructureStudio | data collection | . |
| d*TREK | data reduction | . |
| MOLREP | phasing | . |
