X-RAY DIFFRACTION
Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
---|---|---|---|---|---|---|---|---|
1 | 200 K |
Source | Type | Wavelength List | Synchrotron Site | Beamline |
---|---|---|---|---|
ROTATING ANODE | RIGAKU FR-E DW | 1.54 | ? | ? |
Software Name | Purpose | Version |
---|---|---|
d*TREK | data scaling | 9.6L |
CNS | refinement | . |
PDB_EXTRACT | data extraction | 3.10 |
StructureStudio | data collection | . |
d*TREK | data reduction | . |
MOLREP | phasing | . |