X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 ? 2.0 M AMMONIUM SULFATE, 0.1 M CITRATE, PH 5.0, 10 mM DTT, 0.2 mM EDTA
Unit Cell:
a: 42.040 Å b: 43.070 Å c: 59.450 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 1.90 Solvent Content: 34.69
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD DURING REFINEMENT 1.6 8.0 26492 880 96. 0.1808 0.2040 11.1
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 30.0 96.0 0.0740000 0.0550000 18.2 4.5 ? 32355 ? 5. 12.2
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.60 1.66 78.8 ? 0.1890000 5.3 2.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X12C 0.95, 1.1 NSLS X12C
Software
Software Name Purpose Version
X-PLOR model building 3.0
X-PLOR refinement 3.0
DENZO data reduction .
SCALEPACK data scaling .
X-PLOR phasing 3.0
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