X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 283 13% (w/v) PEG 4000, 200mM Mg-acetate, 100mM Na-cacodylate, pH 6.5, vapor diffusion, sitting drop, temperature 283K
Unit Cell:
a: 89.240 Å b: 89.240 Å c: 288.900 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 61 2 2
Crystal Properties:
Matthew's Coefficient: 3.09 Solvent Content: 60.24
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD ? 2.5000 29.6450 24543 1568 99.9800 0.1983 0.2382 81.4639
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.300 30.0 99.700 0.060 ? 38.490 ? ? 31308 ? -3.000 71.846
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.300 2.360 96.900 ? ? 3.1 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 ? K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.9788, 0.9184, 0.9796, 0.9794 SLS X06SA
Software
Software Name Purpose Version
XSCALE data processing .
PHENIX refinement 1.6.1_357
PDB_EXTRACT data extraction 3.10
ADSC data collection Quantum
XDS data reduction .
XSCALE data scaling .
CNS phasing .