X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 289 0.16 M magnesium chloride, 0.08 M Tris HCl pH 8.5, 24 %w/v PEG4000, 20 % v/v glycerol, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 125.377 Å b: 109.089 Å c: 58.224 Å α: 90.00° β: 117.63° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.34 Solvent Content: 47.45
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.900 38.915 54133 2750 99.19 0.156 0.192 37.9
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 50 99.9 ? 0.095 11.3 4.9 54312 54312 0.0 0.0 32.3
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.9 1.92 100 ? 0.741 2.5 4.8 2734
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97929 APS 19-ID
Software
Software Name Purpose Version
HKL-3000 data collection .
HKL-3000 phasing .
SHELXS phasing .
MLPHARE phasing .
BUCCANEER model building .
PHENIX refinement (phenix.refine: 1.6.2_432)
HKL-3000 data reduction .
HKL-3000 data scaling .
BUCCANEER phasing .
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