ISDA

3NI0

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	4.6	290	0.1 M phosphate/citrate, 35% isopropanol, 5% PEG 1000, pH 4.6, VAPOR DIFFUSION, HANGING DROP, temperature 290K

Unit Cell:

a: 33.685 Å b: 100.831 Å c: 110.432 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: I 21 21 21

Crystal Properties:

Matthew's Coefficient: 2.09 Solvent Content: 41.28

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	1.601	32.154	23628	1196	93.32	0.2149	0.2369	?

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.60	50.0	99.6	0.064	?	28.0	6.5	25314	25314	0.0	0.0	23.3

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.60	1.66	100.0	?	?	4.1	6.5	2465

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	ALS BEAMLINE 4.2.2	1.00007	ALS	4.2.2

Software