X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.5 294 0.1M sodium acetate PH 4.5, 200MM, ammonium sulfate, 30% PEG400, 1.5% 1,2,3-heptanetriol, VAPOR, DIFFUSION, SITTING DROP, TEMPERATURE 294K, VAPOR DIFFUSION, HANGING DROP
Unit Cell:
a: 39.310 Å b: 72.910 Å c: 88.760 Å α: 90.00° β: 101.99° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.09 Solvent Content: 41.14
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SIRAS THROUGHOUT 1.30 19.51 118512 5962 98.61 0.17230 0.18318 19.942
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.3 20.0 98.7 0.074 0.074 5.0 2.8 118539 118539 ? ? 14.24
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.30 1.37 99.4 ? 0.266 2.8 2.2 17399
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON MPG/DESY, HAMBURG BEAMLINE BW6 0.976 MPG/DESY, HAMBURG BW6
Software
Software Name Purpose Version
MAR345 data collection .
SHELXCD phasing .
SHELXD phasing .
SHELXE model building .
SHARP phasing .
ARP/wARP model building .
REFMAC refinement 5.2.0019
MOSFLM data reduction .
SCALA data scaling .
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