ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.5	293	20mM HEPES pH 7.2, 0.075M MES pH 6.5, 9 % (w/v) PEG 20000, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Unit Cell:

a: 84.575 Å b: 84.575 Å c: 124.412 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: P 43

Crystal Properties:

Matthew's Coefficient: 2.64 Solvent Content: 53.40

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	1.80	30.00	76177	4026	99.62	0.17283	0.21222	26.216

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.8	84.52	99.6	0.046	?	32.8	3.8	80571	80249	0	0	23.2

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.8	1.86	97.3	?	?	2.3	3.3	7790

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	EMBL/DESY, HAMBURG BEAMLINE X12	0.953	EMBL/DESY, HAMBURG	X12

Software