X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 293 0.1 M Tris pH 8.5, 0.2 M Lithium sulfate, 20% PEG 3400, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 93.940 Å b: 161.837 Å c: 121.622 Å α: 90.00° β: 95.82° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.80 Solvent Content: 56.08
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.880 46.728 80301 4041 99.0 0.2154 0.2648 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.88 50.0 99.0 0.087 ? 17.1 4.7 81200 80388 0.2 0.2 69.75
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 1.01 APS 19-ID
Software
Software Name Purpose Version
HKL-3000 data collection .
AMoRE phasing .
PHENIX refinement (phenix.refine)
HKL-3000 data reduction .
HKL-3000 data scaling .