X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? ? VAPOR DIFFUSION, SITTING DROP
Unit Cell:
a: 44.668 Å b: 44.943 Å c: 42.204 Å α: 109.27° β: 90.50° γ: 62.43°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.93 Solvent Content: 36.43
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.75 11.41 26354 1339 96.94 0.1655 0.1950 21.29
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.73 50 97 ? 0.040 30 3.9 ? 27466 0 0 20.02
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.73 1.76 94 ? ? 7.8 3.4 1391
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-BM 1 APS 17-BM
Software
Software Name Purpose Version
StructureStudio data collection .
AMoRE phasing .
BUSTER refinement 2.9.4
HKL-2000 data reduction .
HKL-2000 data scaling .