3N4M

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.5 293.2 100 mM sodium acetate (pH 4.5), 625 mM NaCl, VAPOR DIFFUSION, HANGING DROP, temperature 293.2K
Unit Cell:
a: 175.730 Å b: 175.730 Å c: 160.100 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 62 2 2
Crystal Properties:
Matthew's Coefficient: 6.40 Solvent Content: 80.77
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.987 38.51 29042 1481 96.500 0.199 0.224 110.384
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.987 38.51 98.900 0.085 0.085 11.5 4.500 29113 29113 -1 2.5 99.7
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.02 3.18 99.5 ? 1.106 1.6 4.6 4202
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 1.10 NSLS X29A
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling 3.3.16
PHENIX refinement .
PDB_EXTRACT data extraction 3.100
CBASS data collection .
AMoRE phasing .